ICDS 2027

The International Conference on Defects in Semiconductors (ICDS) is a biennial scientific meeting dedicated to the study of point and extended defects in semiconductor materials. Established in 1959, the conference has evolved into a prominent platform for researchers and industry professionals to discuss both fundamental and applied aspects of defect-related phenomena in semiconductors. The 34th edition of ICDS is scheduled to take place from July 26 to 29, 2027, at the University of Strathclyde in Glasgow, Scotland, with a tutorial day planned for July 25.

ICDS 34 will cover a wide array of topics, including the electrical, vibrational, optical, and magnetic properties of defects in semiconductors. The conference will emphasize defect engineering and its impact on future technologies such as microelectronics, quantum computing, optoelectronics, and renewable energy. Additionally, novel approaches to characterizing and modeling defects will be a key focus, alongside discussions on emerging materials like wide-band-gap semiconductors, doped nanoparticles, and two-dimensional materials.

Attendees can look forward to engaging sessions featuring leading experts in the field, as well as opportunities for networking and collaboration. The conference will also include the presentation of the Corbett and Haller prizes, which recognize outstanding contributions by young scientists and graduate students, respectively. These awards highlight the conference's commitment to fostering new talent and advancing research in semiconductor defect studies.

ICDS 34 is ideal for scientists, engineers, and students involved in semiconductor research and development. Participants will gain valuable insights into the latest advancements in defect characterization and engineering, and have the chance to collaborate with peers from around the world. The conference provides a unique platform for sharing knowledge and driving innovation in the field of semiconductor materials and devices.